Sievers TOC Analyzers offer unsurpassed low TOC level performance, while maintaining high sensitivity and resistance to interfering compounds harmful to the manufacturing process.

Semiconductor/Display Overview

Sievers instruments simplify the toughest analytical challenges facing semiconductor and microelectronics UPW systems. From low parts-per-million (ppm) to low part-per-billion (ppb) concentrations prior to final polishing, manufacturers in electronics, microelectronics, and semiconductor industries deal with a wide range of total organic carbon (TOC), and a variety of challenges in measuring TOC accurately. They also are concerned with silica control. Key applications for our instruments include: