New Sievers 500 RLe TOC Analyzer Accurately Detects Problematic Ultra Low-Level Compounds in Microelectronics Waters

BOULDER, COLORADO, October 16, 2007 — GE Analytical Instruments, a division of GE Water & Process Technologies, announces the new Sievers 500 RLe On-Line Total Organic Carbon (TOC) Analyzer, which accurately detects problematic compounds such as urea, trimethylamine, organic acids and bases in ultra low-level waters. The 500 RLe is designed for microelectronics applications and can be placed throughout the UPW process system and in the polish loop.

The reagentless Sievers 500 RLe monitors TOC in waters ranging from 0.03 ppb to 2.5 ppm with conductivity up to 25 µS/cm.  It uses GE Analytical Instruments’ patented membrane-conductometric technology, delivering ultra low-level accuracy and reliability by eliminating false positive and false negative readings associated with other simplified TOC technologies.  As demonstrated in published studies, the Sievers 500 RLe is the only TOC analyzer to detect problematic organic compounds that present significant risk to fab operations.

Additionally, the 500 RLe is the only analyzer designed specifically to work in low dissolved oxygen  (DO) and hydrogenated water systems, both of which are becoming more common in microelectronics applications.   Low DO systems lack sufficient oxygen to facilitate full oxidation, resulting in artificially low TOC results. 

The Sievers 500 RLe comes in two models:  The 500 RLe with Standard iOS (Integrated On-Line Sampling System) that enables on-site calibration, running of standards and grab samples; and the economical Base Model that uses a simplified sample inlet block to facilitate continuous on-line operation. 

The Sievers 500 RLe shares many productivity and ease-of-use features of other Sievers TOC Analyzers, including 12-month calibration stability, a color touch-screen display, USB port, and minimal maintenance (a few hours per year).

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